The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6501086 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 31, 2002

Filed:

Mar. 08, 2001
Applicant:
Inventor:

Rolf Leuenberger, Hermatswil, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/193 ;
U.S. Cl.
CPC ...
G01N 2/193 ;
Abstract

The invention relates to a method and a device for evaluating defects in flat textile structures. To be able to provide a method and a device which permit the repeated and unambiguous evaluation of defects in flat textile structures, the invention provides for an image ( ) of a flat structure to be generated such that at least two representations of defects (2-17) in the flat structure appear in the image which differ in terms of the length and contrast of the defect. On the basis of said representations a decision is taken as to whether a defect in the flat structure is admissible or inadmissible. To this end a tabular or matrix-like arrangement of representations of different kinds of defects is created and an image of a defect-free flat surface is used as background.


Find Patent Forward Citations

Leuenberger, Rolf. (2002). Method and device for evaluating defects in flat textile structures (U.S. Patent No. 6501086). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6501086

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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