The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Mar. 22, 2001
Applicant:
Inventors:
Cyrill Bucher, Bassersdorf, CH;
Roger Pidoux, Uitikon, CH;
Assignee:
Zellweger Luwa AG, Uster, CH;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/04 ; C25D 5/10 ; D02J 3/16 ;
U.S. Cl.
CPC ...
G01L 5/04 ; C25D 5/10 ; D02J 3/16 ;
Abstract
The invention relates to a measuring device for thread-like test samples ( ), comprising a measuring slit ( ) exhibiting measuring areas ( ) for measuring characteristics of a test sample which moves longitudinally, said measuring areas being associated to a measuring device. A coating ( ) made of an abrasion-resistant material is applied over the whole measuring slit and its measuring areas ( ) in order to define more freely the dimensions of said measuring slit and especially to obtain a narrower measuring slit.