The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2002

Filed:

Mar. 20, 2001
Applicant:
Inventors:

Yi Li, Kowloon, HK;

Weilin Xu, Kowloon, HK;

Kwok-wing Yeung, Kowloon, HK;

Yi-lin Kwok, Kowloon, HK;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/336 ;
U.S. Cl.
CPC ...
G01N 3/336 ;
Abstract

Moisture management indexes are determined for a textile sandwiched between two plates. Electrical conductors arranged in concentric opposing pairs are used to measure changes in electrical resistance of the fabric. A quantity of water (or other chosen liquid) is poured down a guide pipe and changes of resistance measured against time. From this data, specific indexes are determined, in a repeatable fashion, and used for determining moisture management characteristics of the fabric.


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