The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2002
Filed:
Jun. 15, 2001
Applicant:
Inventors:
Matthew John Morley, Saratoga, CA (US);
Yaron Kashai, Sunnyvale, CA (US);
Assignee:
Verisity Ltd., Rosh Haayin, IL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract
A system and method for enabling the behavior of temporal expressions to be analyzed for the evaluation of such expressions. The process of evaluating such expressions ultimately results in the construction of a finite state machine, such that the set of non-deterministic functions for describing the behavior of dynamic and relativistic systems is reduced to such a system. The behavior of the finite state machine can then be examined and analyzed. The present invention is useful for such applications as the examination of the temporal behavior of a DUT (device under test), as well as for examining the behavior of dynamic systems.