The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2002

Filed:

Sep. 20, 2000
Applicant:
Inventors:

Yuri C. Gaidoukevitch, Leiderdorp, NL;

Kevin W. Ryan, Silver Spring, MD (US);

Dean E. Sequera, Kensington, MD (US);

Assignee:

Media Cybernetics Inc., Silver Spring, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 ;
U.S. Cl.
CPC ...
G06K 9/34 ;
Abstract

A method, system, and product for analyzing a digitized image of an array to create an image of a grid overlay. The method comprising the steps of locating the center of each object on the array, determining a standard shape and size for the objects, and creating a final image of the grid overlay. Preliminary procedures can be used to normalize the image so that optimal results can be obtained. Sub-grids can be identified and objects repositioned within their corresponding sub-grids. Noise can be removed by filtering processes based on object size, intensity, and location.


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Gaidoukevitch, Yuri. (2002). Method, system, and product for analyzing a digitized image of an array to create an image of a grid overlay (U.S. Patent No. 6498863). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6498863

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