Twisted bitlines to reduce coupling effects (dual port memories)

Abstract

A method for reducing electrical coupling within a computer multi-port memory cell array is provided. The method comprises twisting complementary wires of a first, inner bit line pair in a first memory cell column, wherein the twisting reverses the complementary wires, and wherein the physical twisting occurs in odd numbered dummy rows, twice along a column. The complementary wires of a second, outer bit line pair in the same column, wherein the physical twisting occurs in even numbered dummy rows, once along the column. The complementary wires of a third, inner bit line pair in a second memory cell column are then twisted, wherein the physical twisting occurs in even numbered dummy rows, once along the column, and the complementary wires of a fourth, outer bit line pair in the second column are twisted in odd numbered dummy rows, twice along the column. In this manner the twisting of bit line pairs is alternated within each memory cell column, and the twisting pattern is alternated between columns, thus ensuring that the net distance between any given wire and each complementary wire of another bit pair is equal.