The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2002
Filed:
Jan. 04, 2001
Applicant:
Inventors:
Nicholas J. Frigo, Red Bank, NJ (US);
Evan L. Goldstein, Princeton, NJ (US);
Lih-Yuan Lin, Little Silver, NJ (US);
Chuan Pu, Middletown, NJ (US);
Robert William Tkach, Little Silver, NJ (US);
Assignee:
AT&T Corp., New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/03 ;
U.S. Cl.
CPC ...
G02F 1/03 ;
Abstract
The invention provides methods and systems for micro-machined tunable delay lines. Particularly, the micro-machined tunable delay lines of the present invention utilize adjustable micro-machined micro-mirrors to alter the path length traversed by an optical signal.