The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2002
Filed:
Mar. 30, 2001
Applicant:
Inventor:
Tuyoshi Ishikawa, Tokyo, JP;
Assignee:
Pentax Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/155 ;
U.S. Cl.
CPC ...
G01N 2/155 ;
Abstract
A pattern reading apparatus includes a minute-area light source positioned such that an illumination light beam is incident on an object surface having a pattern formed thereon as an object to be read without passing through a lens. An objective lens converges a light beam having information of the pattern. A spatial filter has a shading region that shades a portion of the light beam having passed through the objective lens, the portion forming an image of the light source. An imaging element reads an image of the pattern formed by the light beam having passed through the spatial filter.