The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2002
Filed:
Mar. 24, 2000
Pekka M. Typpo, Cupertino, CA (US);
Wolfgang Griech, Heidenheim, DE;
Voith Sulzer Papiertechnik Patent GmbH, Heidenheim, DE;
Abstract
Apparatus and process for determining the properties of a material web. The apparatus includes at least one radiation source, and at least one detection device adapted to detect radiation emitted from the at least one radiation source that at least one of penetrates and is reflected by the material web. The detection device can include at least one detection area unevenly divided into a plurality of individual sensors. Further, the material web can be a paper web. The invention relates to a device and a process for determining the properties of a material web, particularly a paper web, having at least one radiation source and at least one detection device for radiation that is emitted by the radiation source and that penetrates and/or is reflected by the material web, said detection device having at least one detection area unevenly divided into a large number of individual sensors.