The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2002
Filed:
Nov. 07, 2000
Kenichi Kawasaki, Kawasaki, JP;
Yasuharu Sato, Kawasaki, JP;
Terumasa Kitahara, Kawasaki, JP;
Masao Nakano, Kawasaki, JP;
Masao Taguchi, Kawasaki, JP;
Yoshihiro Takemae, Kawasaki, JP;
Yasurou Matsuzaki, Kawasaki, JP;
Koichi Nishimura, Kawasaki, JP;
Yoshinori Okajima, Kawasaki, JP;
Naoharu Shinozaki, Kawasaki, JP;
Hiroko Douchi, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
Disclosed is a semiconductor device for outputting an output signal with a given phase held relative to an external clock despite a difference in characteristic, a change in temperature, and a fluctuation in supply voltage. The semiconductor device comprises an input circuit for inputting the external clock and outputting a reference signal, an output circuit for receiving an output timing signal and outputting an output signal according to the timing of the output timing signal, and an output timing control circuit for controlling the output timing so that the output signal exhibits a given phase relative to the external clock. The output timing control circuit includes a delay circuit for delaying the reference signal by a specified magnitude and generating an output timing signal, a phase comparison circuit for comparing the phase of the output timing signal with the phase of the reference signal, and a delay control circuit for specifying the magnitude of a delay to be produced by the delay circuit according to the result of comparison performed by the phase comparison circuit.