The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2002

Filed:

May. 31, 2000
Applicant:
Inventor:

Yoshinori Matsuyama, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 1/300 ;
U.S. Cl.
CPC ...
G02C 1/300 ;
Abstract

A target lens shape measuring device for measuring a target lens shape for processing an eyeglass lens includes: amount on which at least one of a template and a base of a fixing cup to which a dummy lens is attached is to be mounted; a fixing portion for pressing and fixing the template or the dummy lens mounted on the mount during measurement; a moving mechanism for moving the fixing portion between a pressing position, at which the fixing portion presses the template or the dummy lens, and a non-pressing position; a measuring pin to be brought into contact with a periphery of the template or the dummy lens mounted on the mount; a movement detecting mechanism for detecting an amount of movement of the measuring pin to obtain a target lens shape; and a linking mechanism for moving the measuring pin from a retracted position to a measuring position in linking with movement of the fixing portion to the pressing position by the moving mechanism.


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