The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2002

Filed:

Mar. 15, 2000
Applicant:
Inventors:

Ivan Faul, Boulder, CO (US);

Jesse Dean Paylor, Frederick, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/800 ;
U.S. Cl.
CPC ...
G01D 1/800 ;
Abstract

A system for calibrating an error between the location of a feature of an object as determined by indirect calculation compared to as determined by physical measurement in order to be able to use this determined error to correct the location of the feature as determined by calculation in actual use in the field. This error is found by calculating the position and orientation of the object, having energy emitters disposed thereon, in a plurality of orientations and positions relative to a reference frame, but with the feature in a substantially constant position relative to the reference frame; calculating the locations of the feature of the object from these calculated positions and orientations; averaging these calculated locations; determining the location of the feature by physical measurement thereof in relation to the physical locations of the emitters; and comparing the calculated average location with the physically measured loacation to arrive at the error.


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