The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Sep. 29, 1998
Applicant:
Inventor:

Kinya Osa, Chiyoda-ku, JP;

Assignee:

United Module Corporation, Los Altos, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 ; H04N 1/102 ; H04N 5/217 ;
U.S. Cl.
CPC ...
G06K 9/40 ; H04N 1/102 ; H04N 5/217 ;
Abstract

A filter for removing block deformation that occurs in an image signal is disclosed. Detected are a plurality of differentials each between at least two pixel signal levels on block boundaries between pixel blocks and in the vicinity of the block boundaries in response to pixel signals included in a plurality of pixel blocks that form an image. The differentials are compared with each other to obtain the maximum differential absolute value. The maximum differential absolute value is compared with a reference value to determine whether block deformation occurs in a pixel signal in the vicinity of a position on the pixel blocks where the maximum differential absolute value is obtained. The block deformation is removed when it is determined that the block deformation occurs in the pixel signal in the vicinity of the position on the pixel blocks where the maximum differential absolute value is obtained. It is determined that the block deformation occurs when the maximum differential absolute value is smaller than the reference value. A specific value is added to the pixel signal in the vicinity of the position on the pixel blocks where the maximum differential absolute value is obtained when it is determined that the block deformation occurs. A value pattern with the specific value may be selected from a plurality of predefined value patterns based on random numbers. The selected pattern is added to the pixel signal in the vicinity of the position on the pixel blocks where the maximum differential absolute value is obtained.


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