The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Dec. 27, 1999
Applicant:
Inventors:

Michael F. Deering, Los Altos, CA (US);

Nathaniel David Naegle, Pleasanton, CA (US);

Scott R. Nelson, Pleasanton, CA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/500 ;
U.S. Cl.
CPC ...
G06T 1/500 ;
Abstract

A graphics system that is configured to utilize a sample buffer and a plurality of parallel sample-to-pixel calculation units, wherein the sample-pixel calculation units are configured to access different portions of the sample buffer in parallel. The graphics system may include a graphics processor, a sample buffer, and a plurality of sample-to-pixel calculation units. The graphics processor is configured to receive a set of three-dimensional graphics data and render a plurality of samples based on the graphics data. The sample buffer is configured to store the plurality of samples for the sample-to-pixel calculation units, which are configured to receive and filter samples from the sample buffer to create output pixels. Each of the sample-to-pixel calculation units are configured to generate pixels corresponding to a different region of the image. The region may be a vertical or horizontal stripe of the image, or a rectangular portion of the image. Each region may overlap the other regions of the image to prevent visual aberrations.


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