The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Mar. 26, 1999
Applicant:
Inventors:

Rodney M. Goodman, Altadena, CA (US);

Nathan S. Lewis, La Canada, CA (US);

Robert H. Grubbs, So. Pasadena, CA (US);

Jeffery Dickson, Pasadena, CA (US);

Vincent Koosh, Pasadena, CA (US);

Richard S. Payne, La Jolla, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/714 ;
U.S. Cl.
CPC ...
H01L 2/714 ;
Abstract

Techniques are used to detect and identify analytes. Techniques are used to fabricate and manufacture sensors to detect analytes. An analyte ( ) is sensed by sensors ( ) that output electrical signals in response to the analyte. The electrical signals may be preprocessed ( ) by filtering and amplification. In one embodiment, a plurality of sensors are formed on a single integrated circuit. The sensors may have diverse compositions.


Find Patent Forward Citations

Goodman, Rodney. (2002). Techniques and systems for analyte detection (U.S. Patent No. 6495892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6495892

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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