The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Jun. 21, 2000
Applicant:
Inventors:

Robert R. Alfano, Bronx, NY (US);

Ping-Pei Ho, Great Neck, NY (US);

Assignee:

Research Foundation of CUNY, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/188 ; G01N 2/147 ;
U.S. Cl.
CPC ...
G01N 2/188 ; G01N 2/147 ;
Abstract

A system for non-destructively imaging surfaces through a coating, in accordance with the present invention, includes a near-infrared (NIR) light source for illuminating a coated surface. A detector is positioned in an operative relationship with the NIR light source to receive light backscattered from the coated surface and from the coating. A gating device is positioned in an operative relationship with the detector to selectively permit light to pass to the detector to measure optical characteristics of the backscattered light such that determinations of a state of a surface below the coating is determined based on the optical characteristics of the backscattered light. Methods for performing the non-destructive imaging of the present invention are also disclosed.


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