The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Nov. 05, 1996
Applicant:
Inventor:

Donald F. H. Wallach, Hollis, NH (US);

Assignee:

GroupTek, Inc., Andover, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/302 ;
U.S. Cl.
CPC ...
G01N 3/302 ;
Abstract

The present invention pertains to methods and devices for detecting microbial spoilage of a food product. The method involves placing a spoilage indicator device including a barrier sheet in fluid contact with a food product. The method also involves allowing any reactant molecule of a predetermined size produced in the food product by microbial spoilage to traverse the barrier sheet to contact a carrier of the device and to react with an indicator material therein. The method further provides observing the spoilage indicator to determine whether the detectable change has occurred in the indicator material. The detectable change indicates a build-up of the reactant molecule in the food product and therefore is indicative of microbial spoilage.


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