The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Jun. 08, 2001
Applicant:
Inventors:

Sang-Hyun Kim, Seoul, KR;

Seok-Bin Ko, Seoul, KR;

Assignee:

Medison Co., Ltd., Kangwon-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

A system and a method generate a 3-D image by fast computing the distance between adjacent 2-D images. The method comprises the steps of: producing a first main frame, a second main frame parallel to the first main frame, and a supplementary frame inclined at an angle with respect to the first main frame; creating a virtual frame by using the first main frame and the supplementary frame; calculating a first correlation coefficient between the first main frame and the virtual frame; computing a second correlation coefficient between the first and second main frames; and estimating a distance between the first and second main frames. The system comprises a probe for generating pairs of image frames; a distance calculating unit for calculating distances between main frames of the pairs; and a screen for displaying a 3-D image of the target produced by using the distances.


Find Patent Forward Citations

Kim, Sang-Hyun. (2002). System and method for three-dimensional ultrasound imaging using a steerable probe (U.S. Patent No. 6494837). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6494837

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…