The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2002
Filed:
Sep. 13, 1999
Glen W. Davis, Junction City, OR (US);
Jonathan R. Brandt, Eugene, OR (US);
PSC Scanning, Inc., Eugene, OR (US);
Abstract
In a bar code scanning system, information at the leading and trailing ends of a label is corrected to adjust for distortion due to mechanical aspects of the scan line mechanism that might otherwise render information unreadable. The speed of the scanning spot can be characterized over the course of the scan line. With knowledge of the rate of change of the scan mechanism speed at the ends of the scan line, as well as position information in relation to change in speed over the scan line, a measure of the associated time distortion with respect to elements encoded in the scan line information may be established. In turn, a compensation curve may be determined to identify the offset that may be applied to the collected data to compensate for the variation in speed. In a further aspect, interpolation techniques may similarly be implemented to compensate for the distortion of elements on rounded surfaces; potential offset amounts could be determined and implemented to adjust for character/element width distortion. Such offsets could be used either directly on identified character/element widths, or they may be implemented as part of a secondary, more aggressive technique to fit elements/characters into a known pattern during reconstruction.