The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2002
Filed:
Dec. 16, 1999
Jiro Matsuda, Tsukuba, JP;
Abstract
A CMM calibrating gauge includes a block gauge which has a first end face and an opposite second end face and whose length absolute value has been certified, and a sphere fixed to a front surface of the block gauge. A method for calibrating a CMM using the CMM calibrating gauge includes the steps of bringing a probe of the CMM into contact with the first end face of the block gauge to specify planarity of the first end face, bringing the probe into contact with the peripheral surface and the pole point of the sphere to specify coordinates of the center of the sphere relative to the first end face and the diameter of the sphere, bringing the probe into contact with the second end face of the block gauge to measure planarity of the second end face, and bringing the probe into contact with the peripheral surface and the pole point of the sphere to measure coordinates of the center of the sphere relative to the second end face and the diameter of the sphere and revise the specified planarity of the first end face and the specified sphere center coordinates and sphere diameter, thereby specifying three-dimensional dimensions of the CMM calibrating gauge to calibrating the CMM.