The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Dec. 30, 1999
Masaaki Sugimoto, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A method of analyzing a distribution of fault elements is applied to a semiconductor integrated circuit including a plurality of elements which are repeatedly arranged in a pitch of one length unit in a specific direction. The method is accomplished by generating a position of each of fault elements in the semiconductor integrated circuit, and by performing a first determination of whether an appearance expectation function value is larger than a reference value, for each of divisors of the number of length units between fault elements, the number of length units being larger than one length unit. Also, the method is accomplished by performing a second determination of whether a distribution of the fault elements includes a regular distribution, based on the appearance expectation function value and a reference value, and by representing the determining result of the second determination.