The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Mar. 02, 2000
Applicant:
Inventors:
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/108 ; G01R 2/728 ;
U.S. Cl.
CPC ...
G01R 3/108 ; G01R 2/728 ;
Abstract
A method and arrangement for performing a memory built-in self test (MBIST) of an external memory and an internal memory of a network interface controller includes a series of burst write and burst read operations if an external memory is detected. The sequence of burst operations tests the back-to-back burst write, back-to-back burst write burst read, back-to-back burst read and back-to-back burst read burst write capabilities of the external memory, to thereby fully exercise the external memory. Additionally, the internal memory is tested by single write and single read accesses.