The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Sep. 24, 1999
Evan W. Steeg, Kingston, CA;
Queen's University at Kingston, Kingston, CA;
Abstract
A method and system for detecting coincidences in a data set of objects, where each object has a number of attributes. Iteratively, equally-sized subsets of the data set of sampled, and coincidences (co-occurrences of a plurality of attribute values in one or more objects in the subset) are recorded. For each coincidence of interest, the expected coincidence count is determined and compared with the observed coincidence count; this comparison is used to determine a measure of correlation for the plurality of attributes for the coincidence. The resulting set of k-tuples of correlated attributes is reported, a k-tuple of correlated attributes being a plurality of attributes for which the measure of correlation is above a predetermined threshold. The method and system (implemented on an array of processing nodes) is suitable for protein structure analysis, e.g. in HIV research.