The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Oct. 09, 2001
Applicant:
Inventor:
George Gutman, Birmingham, MI (US);
Assignee:
Advanced X-Ray Technology, Inc., Bloomfield Hills, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 1/06 ;
U.S. Cl.
CPC ...
G21K 1/06 ;
Abstract
An X-ray source is provided for delivering a high intensity X-ray beam with a predefined energy level of monochromatization, intensity and spatial distribution to a desired region of a sample. The source includes a linear accelerator with a thin anode an electron trap for separating an electron beam from an X-ray beam and conditioning optics which direct, shape and monochromatize the X-ray beam. The conditioning optics include a housing within which are contained entrance slits, multi layer Kirkpatrick-Baez mirrors, exit slits, and a stop diaphragm. The invention also include a method of generating X-rays and a method of using them.