The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Dec. 23, 1998
Marian Kramarczyk, Suffern, NY (US);
David Foni, Englewood, NJ (US);
Haim Jacobson, Tenafly, NJ (US);
Dobrin Tzotzkov, Ridgefield, NJ (US);
ADC Telecommunications, Inc., Eden Prairie, MN (US);
Abstract
A system and method for accessing a number of communication lines by one or more testing devices are disclosed. Each of the communications lines is coupled through the system and includes a first termination at a first telecommunications termination site and a second termination at a second telecommunications termination site. The system includes a number of line access devices, each of which is coupled to at least one of the communication lines terminating at the first telecommunications termination site and at least one of the communication lines terminating at the second telecommunications termination site. One or more monitoring busses are defined by a number of relays, one or more of which is coupled to one of the line access devices. A test device interface, which is selectively coupled to the bus, provides bi-directional connectivity between the selected communication line and a selected testing device coupled thereto. An activated one or more of the relays couples a selected one of the communication lines to a selected one of the testing devices via the test device interface. One or more signal paths defined as passing through the relays, test device interface, and a portion of the line access devices define untapped point-to-point connections. The testing access system and method of the present invention accommodates various high speed digital transmission line protocols. The transmission lines coupled through the system may comprise high speed digital transmission lines characterized by transmission rates on the order of tens or hundreds of megabits per second (Mbps).