The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Oct. 04, 1999
Rongqing Hui, Lawrence, KS (US);
Maurice S. O'Sullivan, Ottawa, CA;
Nortel Networks Limited, St. Laurent, CA;
Abstract
The present invention provides a method and apparatus for monitoring optical signals with an expand frequency resolution. The invention permits high-resolution measurements of optical signal spectrums while retaining wide bandwidth operation through appropriate control circuitry. An interferometer having a periodic frequency response formed of equally spaced narrow-band peaks is used to sweep the entire signal spectrum. The interferometer frequency response is incrementally tuned in cycles so that each of its frequency response peaks cyclically scans a particular spectral band of the signal spectrum. During each cycle, the interferometer isolates multiple,spectrally resolved portions of the optical signal spectrum where each portion originates frog different spectral band. In this way, a high-resolution measurement of the entire signal spectrum can be obtained. The invention may be network protocol independent and can be incorporated into an optical spectrum analyzer or directly into any optical terminal. The invention can be used for signal spectrum monitoring applications including link quality monitoring (LQM) in optical communications networks to monitor various transmission parameters such as such as carrier wavelengths, optical signal-to-noise ratios (SNR), amplified spontaneous emissions (ASE), noise levels, optical non-linearities or other signal baseband information such as data rates and formats.