Atr measuring cell for ftir spectroscopy

Abstract

A total reflection measuring cell for the spectroscopic examination of a sample in an IR spectrometer comprising an ATR crystal ( ) having a plane surface ( ) and a diaphragm clamped in a clamping frame ( ) is characterized in that, additionally a tensioning device is provided for parallel displacement of the diaphragm on an inner partial area of its surface clamped between the legs of the clamping frame ( ) in the direction of the plane surface ( ) of the ATR crystal ( ) that the displaced inner partial area of the diaphragm surface has a higher tension than the clamped diaphragm surface merely clamped in the clamping frame ( ) before, and that a stop is provided towards which the tensioning device is forced and fixed in that position such that the inner partial area of the diaphragm surface has always the same defined separation from the plane surface ( ) of the ATR crystal ( ). In this fashion, it is possible to exactly keep the separation from the plane surface ( ) of the ATR crystal ( ) despite the tendency of the diaphragm to form waves or sag. The otherwise caused quantitative measuring errors due to waviness or displacement of the diaphragm in the IR spectrum can be prevented and thus a considerably higher measurement accuracy can be guaranteed and the quality of the measurement results can be reliably ensured.