The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Dec. 11, 2000
Applicant:
Inventor:
Sheldon L. Epstein, Wilmette, IL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ;
Abstract
A system for measuring properties of an optical component, such as a progressive, multifocal ophthalmic spectacle lens comprises a design having a set of concentric circles, means for recording images of the design directly and through the optical component in a computer memory, means for superimposing the images to form a moiré-effect pattern and a method for analyzing the pattern to measure a property (e.g., powers) of the optical component that includes a comparison of a portion of the pattern generated with the component with a portion of a pattern generated by a master component.