The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2002
Filed:
Jan. 18, 2001
Applicant:
Inventors:
Fumihiko Nakazawa, Kawasaki, JP;
Satoshi Sano, Kawasaki, JP;
Atsuo Iida, Kawasaki, JP;
Nobuyasu Yamaguchi, Kawasaki, JP;
Yasuhide Iwamoto, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06M 7/00 ;
U.S. Cl.
CPC ...
G06M 7/00 ;
Abstract
In order to measure a scanning light cut-off region, an output of a light receiving element and a threshold value set by an MPU are compared by a comparator and a region where the former is smaller than the latter is measured as the scanning light cut-off region. During one cycle of optical scanning, this threshold value is switched in a plurality of stages according to the scanning angle. By accurately measuring the scanning light cut-off region, the correct position and size of an indicator such as a finger or pen are calculated.