The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2002

Filed:

Sep. 15, 2000
Applicant:
Inventor:

Charles Harold Wick, Darlington, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 9/30 ;
U.S. Cl.
CPC ...
G01N 9/30 ;
Abstract

A system and method for detecting the presence of submicron sized particles in a sample taken from the environment includes a collecting a sample from the environment and purifying and concentrating the submicron particles in a sample based on the size of the particles. The purified and concentrated particles are detected with an apparatus which includes an electrospray assembly having an electrospray capillary, a differential mobility analyzer which receives the output from the capillary, and a condensation particle device for counting the number of particles that pass through the differential mobility analyzer. The system is intended to collect a sample containing submicron size particles having a size from about 10 to about 350 nanometers and include submicron size particles selected from the group consisting of viruses, prions, macromolecules, proteins, satellites, and virus fragments. Automated controls can be utilized to control the flow of the sample through the system.


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