The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2002

Filed:

Apr. 28, 2000
Applicant:
Inventor:

Masaru Murakami, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

External connection terminals A to D of an integrated circuit are connected to each terminal of elements to to be measured for a process parameter using interconnections. Among the interconnections, one to connect the base of a bipolar transistor and external connection terminal B for example is provided with a switch . A terminal of a particular element and an external connection terminal are connected by turning on of the switch . Thus, a process parameter of the bipolar transistor is measured using the external terminals to which each terminal of the bipolar transistor is connected.


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Murakami, Masaru. (2002). Integrated circuit device having process parameter measuring circuit (U.S. Patent No. 6489799). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6489799

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