The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2002
Filed:
Jun. 05, 2001
Habib Vafi, Brookfield, WI (US);
Farshid Farrokhnia, Brookfield, WI (US);
Donald F. Langler, Brookfield, WI (US);
Kenneth S. Kump, Waukesha, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
An x-ray system ( ) include a digital detector ( ) that defines two regions: a first region ( ) suitable for generating data useful for creating a patient x-ray image and a second region ( ) less suitable for generating such data than the first region. A source ( ) transmits x-rays through a phantom ( ) located between the source and the second region ( ) so that the detector ( ) generates test data in the second region. A processor ( ) measures at least one parameter in response to the test data and stores a value of the parameter at one point of time. The processor compares the first value with a second value of the one parameter generated at a later second point in time. The processor also generates a result signal representing the results of the comparison.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile