The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2002

Filed:

Dec. 18, 2000
Applicant:
Inventors:

John R. Debesis, Penfield, NY (US);

Edward P. Furlani, Lancaster, NY (US);

Marek W. Kowarz, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 ;
U.S. Cl.
CPC ...
G01L 1/24 ;
Abstract

A strain gauge for measuring strain in a structural member, including: a light modulator adapted to be attached to the structural member, further including: a plurality of deformable elements, each of said deformable elements having a reflective surface and a resonant frequency that varies as a function of strain on the element; means for exerting a force to the deformable elements to cause them to deform at their resonant frequency between first and second operating states, an optical system for directing incident light onto the light modulator, and directing modulated light from the light modulator to a sensor that provides an output signal that varies as a function of the resonate frequency of said deformable elements; and means for generating a representation of the strain in the structural member from said output signal.


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