The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2002

Filed:

Dec. 22, 1999
Applicant:
Inventors:

Ho Wai Wong-Lam, Los Altos, CA (US);

Mark Douglas Naley, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/06 ;
U.S. Cl.
CPC ...
G06F 9/06 ;
Abstract

A method and system for programmed interaction with integrated circuits (ICs) are disclosed in various embodiments. The system allows a hard-coded program that is suitable for a family of ICs having certain characteristics in common to be dynamically adapted for use with specific ICs within the family. To test a specific IC within a family, the register characteristics and one or more program operations that are particular to the specific are obtained. During execution, the hard-coded program is adapted to interact with the specific IC using the register characteristics and the one or more program operations of the specific IC.


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