The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2002

Filed:

Jun. 09, 2000
Applicant:
Inventors:

Eiichi Serita, Tokyo, JP;

Hiroki Hasegawa, Tokyo, JP;

Hideki Hosoi, Ohmagari, JP;

Assignee:

Tanita Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

The present invention relates to a method and an apparatus for measuring a distribution of body fat for human body. The method comprises the step of measuring a bioelectrical impedance and a thickness of abdominal subcutaneous fat, based on the personal data such as sex, age, height, weight, etc. The method further comprises the step of calculating an area or an amount of abdominal visceral fat or abdominal subcutaneous fat, based on the measurements of the bioelectrical impedance and the thickness of abdominal subcutaneous fat as well as the girth of abdomen. According to another embodiment of the present invention, the method comprises the step of measuring the thickness of abdominal subcutaneous fat and the girth of abdomen. Thereafter, the area of abdominal visceral fat and the area of abdominal subcutaneous fat are calculated, based upon the measurements of the thickness of abdominal subcutaneous fat and the girth of abdomen.


Find Patent Forward Citations

Serita, Eiichi. (2002). Method and apparatus for measuring distribution of body fat (U.S. Patent No. 6487445). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6487445

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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