The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2002
Filed:
Jan. 19, 2001
Curtis K. Deckert, Santa Ana, CA (US);
Roger L. Hildwein, Woodinville, WA (US);
Robert F. McConaghy, Kirkland, WA (US);
Julie R. Parnell, Bothell, WA (US);
Ann M. Thomas, Seattle, WA (US);
Robert L. Wilcox, Bothell, WA (US);
LifeSpex, Inc., Bothell, WA (US);
Abstract
A variety of optical probes and methods have utility in the examination of various materials, especially materials in the interior of cavities having restricted access through orifices or passageways. One type of such optical probe is elongated and includes a distal optical window, a divergent light source, a spatial mixer, and a light collector. Light from the light source is mixed in the spatial mixer to achieve uniform diffuse light in the vicinity of the optical window. The light collector receives light from the target through the spatial mixer. The optical probe may be made of two sections, a reusable section and a disposable. The disposable is elongated and contains a mounting section, an inside surface suitable for the spatial mixing of light, and an optical element which helps to seal the reusable probe section from the target.