The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2002

Filed:

Jul. 18, 2000
Applicant:
Inventors:

Paul Colbourne, Nepean, CA;

Jian Jim Yang, Ottawa, CA;

Geoff Randall, Waterloo, CA;

Assignee:

JDS Uniphase Inc., Nepean, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ;
Abstract

A method and system are provided for measuring a characteristic of a lens. By directing light to a lens, and receiving reflected light from a opposite end faces of the lens on an image plane, a determination from the focused spots on the image plane can be made as to a characteristic of the lens, such as its focal length.


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