The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2002

Filed:

Sep. 21, 1999
Applicant:
Inventors:

Hidetoshi Nagano, Tokyo, JP;

Takahiro Ishii, Tokyo, JP;

Takashi Totsuka, Chiba, JP;

Naosuke Asari, Chiba, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/700 ;
U.S. Cl.
CPC ...
G06T 1/700 ;
Abstract

The invention provides an image processing apparatus and method and an information providing medium by which a three-dimensional model can be plotted accurately. A model data production section performs a model data production process for shape data and surface color data of a measured object in a corresponding relationship to each other to produce model data and outputs the model data to a model data optimization program section. The model data optimization program section performs a model data optimization process for the model data supplied from the model data production section based on conditions such as a size on a display of the measurement object supplied from a model plotting section, an arithmetic processing performance and a data transmission performance to produce optimization model data, and supplies the optimization model data to the model plotting section. The model plotting section causes the optimization model data supplied from the model data optimization section to be plotted on a VRAM and to be displayed on a display unit.


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