The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2002
Filed:
Mar. 19, 2001
Terrence R. Noe, Sebastopol, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A reflection measurement method and apparatus measures reflection characteristics of a device under test (DUT) when access to the DUT is through a dispersive element. The method and apparatus measure a composite reflection response of a network that includes the DUT and the dispersive element coupled to the DUT via a transmission line. A reflection response of the dispersive element is isolated from a remainder of the composite reflection response of the network. A set of transmission parameters for the dispersive element is generated from the isolated reflection response of the dispersive element and is then applied to the remainder of the composite reflection response of the network to extract the reflection characteristic of the DUT.