The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2002
Filed:
Feb. 21, 2001
Applicant:
Inventors:
Takamichi Muramatsu, Shiki, JP;
Takeshi Fujita, Hiki-gun, JP;
Masaharu Kiyama, Higashimatsuyama, JP;
Takashi Irie, Musashimurayama, JP;
Kazunori Okano, Shiki, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ;
U.S. Cl.
CPC ...
C12Q 1/68 ;
Abstract
Focusing that abundant class genes abundantly present in a nucleic acid sample can comparatively easily be analyzed and readily be removed in a selective manner, a nucleic acid sample for expression analysis of rare expressed genes can be obtained by removing abundant genes therefrom, and analyses based upon the sample can be achieved.
Muramatsu, Takamichi. (2002). Preparation method of nucleic acid sample for rare expressed genes and analyzing method using the prepared nucleic acid samples thereby (U.S. Patent No. 6485916). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6485916
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile