The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2002
Filed:
Dec. 08, 2000
Masanori Sugata, Saitama, JP;
Abstract
A coin inspection method and a device which can inspect a coin with a high precision, by extracting a large amount of information from a sensor detection signal waveform. In coin inspection which is performed based on a detection signal waveform of a magnetic sensor disposed along a coin pathway through which the coin passes, a differential waveform of the detection signal waveform is determined, first information indicating a peak position of the differential waveform, second information indicating a value of the detection signal waveform at the peak position of the differential waveform, and third information indicating a value of the differential waveform at the peak position of the differential waveform are extracted, and the extracted first through third information are used to inspect the coin.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile