The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Mar. 07, 2000
Lee M. Hively, Philadelphia, TN (US);
Paul C. Gailey, Athens, OH (US);
Vladimir A. Protopopescu, Knoxville, TN (US);
Lockheed Martin Energy Research Corporation, Oak Ridge, TN (US);
Abstract
There is presented a reliable technique for measuring condition change in nonlinear data such as brain waves. The nonlinear data is filtered and discretized into windowed data sets. The system dynamics within each data set is represented by a sequence of connected phase-space points, and for each data set a distribution function is derived. New metrics are introduced that evaluate the distance between distribution functions. The metrics are properly renormalized to provide robust and sensitive relative measures of condition change. As an example, these measures can be used on EEG data, to provide timely discrimination between normal, preseizure, seizure, and post-seizure states in epileptic patients. Apparatus utilizing hardware or software to perform the method and provide an indicative output is also disclosed.