The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2002

Filed:

Nov. 10, 1999
Applicant:
Inventors:

Shuh-Yuan Liou, Troy, MI (US);

Yong Pan, Canton, MI (US);

Tony Lu, Canton, MI (US);

Harry Li, Windsor, CA;

Girish Kunjur, Southgate, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

The invention involves a system and a method of inspecting a selected part design from an inventory of computer-aided part designs for die compliance as to the part design's geometric characteristics of die lock, draft, and sharp edge. The invention provides for an improvement of inspecting a computer-aided part design in order to lessen insufficient inspections which lead to manufacturing infeasibilities. The invention includes selecting a part design, defining a die open direction, evaluating die lock and draft characteristics of the selected part design, and evaluating sharp edge characteristics of the selected part design.


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