The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Jul. 31, 2000
Kathleen M. Sheehan, Skillman, NJ (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
A method for diagnostic assessment and proficiency scaling of test results is provided. The method uses as input a vector of item difficulty estimates for each of n items and a matrix of hypothesized skill classifications for each of said n items on each of skills. The method includes using a tree-based regression analysis based on the vector and matrix to model ways in which required skills interact with different item features to produce differences in item difficulty. This analysis identifies combinations of skills required to solve each item, and forms a plurality of clusters by grouping the items according to a predefined prediction rule based on skill classifications. A nonparametric smoothing technique is used to summarize student performance on the combinations of skills identified in the tree-based analysis. The smoothing technique results in cluster characteristic curves that provide a probability of responding correctly to items with specified skill requirements. The probability is expressed as a function of underlying test score.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile