The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Sep. 29, 1997
Roger Spink, Balgach, CH;
Bernhard Braunecker, Rebstein, CH;
Leica AG, Heerbrugg, CH;
Abstract
The invention concerns an imaging system comprising a first device ( ) for acquiring image data for an object ( ) using light, in particular a microscope, and a second device ( ) for acquiring and displaying image data (in particular, of the kind not immediately visible to the eye) for the object ( ) using (in particular invisible) radiation, preferably electromagnetic wave or particle radiation such as X-rays (X-ray or CT photographs), MRI or positron radiation. The system is also provided with a superimposition device ( ) for superimposing the two sets of image data to form a single image which can be turned towards an observer. The optical parameters of the first device ( ), e.g. the microscope and its image distortions, are incorporated in the image to be superimposed, thereby providing the observer with a dimensionally and geometrically accurate display of the two superimposed images.