The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2002

Filed:

Jun. 30, 2000
Applicant:
Inventors:

Ki-hwan Choi, Sungnam-shi, KR;

Young-ho Lim, Suwon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 2/900 ;
U.S. Cl.
CPC ...
G11C 2/900 ;
Abstract

Semiconductor devices are specially made to be amenable to group testing, with special testing apparatus. The devices include at least one additional pad, and a special circuit that includes at least one fuse. After DC testing, the fuse may be cut if the device is flawed. The power supply is then redirected through the additional pad for subsequent AC testing. The circuit is such that, if the fuse were cut, the device is removed from the group, so as not to affect the other devices of the group. But if the fuse were not cut, the device is included for the AC testing.


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