The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Dec. 21, 1995
Method of measuring the read-to-write offset in a disc drive having separate read and write elements
Applicant:
Inventor:
Hieu V. Nguyen, Edmond, OK (US);
Assignee:
Seagate Technology LLC, Scotts Valley, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/58 ;
U.S. Cl.
CPC ...
G11B 5/58 ;
Abstract
A method of measuring the read-to-write offset of a track in a disc drive system having separate read and write elements by measuring read error rate as a function of incremental actuator offset. The actuator is incrementally moved from one edge of the track to the other. The two radial positions which produce read error rates within acceptable limits are identified, and the read-to-write offset is determined by subtracting the offset at which the track was written, from the midpoint of the two radial positions. The read-to-write offset for each track accessed by the transducer is calculated from the read-to-write offset measured at the track.