The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2002

Filed:

Dec. 07, 1999
Applicant:
Inventors:

Ai-Chieh Lu, Taipei, TW;

Fong Lien, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 1/100 ;
U.S. Cl.
CPC ...
G06K 1/100 ;
Abstract

A method for transforming a source image into a target image with the original resolution N time to the target resolution is disclosed. The original image data of pixels is read and stored for N scan lines and grouped into a series of matrices each including N pixels. The matrices are then classified into various matrix types defined previously, wherein matrices with different numbers of original dots are classified as different matrix types. The target image is formed with a plurality of target units each determined based on one corresponding matrix. In general, a target unit is drawn with target dots having a larger total area when its corresponding matrix includes a larger number of the original dots.


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