The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Jun. 12, 2000
Allan H. Clauer, Worthington, OH (US);
Steven M. Toller, Dublin, OH (US);
Jeff L. Dulaney, Dublin, OH (US);
David F. Lahrman, Powell, OH (US);
LSP Technologies, Inc., Dublin, OH (US);
Abstract
A method and apparatus for measuring the quality of a laser peening process, which includes a test element, a mount for the test element, wherein the test element is mounted at a preselected point in the anticipated path of a laser pulse, the laser pulse irradiates the test element, the deflection of the test element is measured in the direction substantially perpendicular and away from the impacted surface of the test element, and the deflection measurement is compared to a previously generated chart showing the relationship between characteristics of test elements and desired material properties.