The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
May. 21, 1998
Theodore Mayer, III, Shadow Hills, CA (US);
Peter J. Inova, Glendale, CA (US);
Metavision Corporation, Burbank, CA (US);
Abstract
An apparatus and method for analyzing the brightness characteristics of a projected image and using the analyzed characteristics to improve the appearance of the projected image is disclosed. In one embodiment of the invention, the brightness characteristics of the projected image are analyzed at selected points across the raster of the image. An analysis array or array of data elements including brightness components corresponding to detail elements is then generated. The data elements in the array are then used to create compensation signals that are applied to the projected image through, for example, an overlay of smoothing factors or generation of a smoothing curve, to enhance the quality or appearance of the image by improving the regularity of brightness in all areas of the image. This regularity of brightness across the full span of the image is useful as a general improvement to the image and as a compensation for projector or projection surface brightness anomalies. In arrayed projection applications, central hot spotting, edge vignetting, electron beam or light source misalignments all can detract from evenly displayed images and all can benefit from the application of compensation that depends on an analysis array of the projected image.